| Calibrated Device |
Coordinate Measuring Machine
|
|---|---|
| Range |
200 mm to 10000 mm
|
|
Uncertainty
|
1.97 × [0.212 + (6.5 × 10-4L)2]1/2 µm
L: measurement length in mm
|
EN
- 【D22】Thin Film Measurement System
- 【D28】Scanning Electron Microscope Calibration System
- 【D27】Nano Particle Functional Property Measurement System
- 【D01】Gauge Block Calibration System - Comparator
- 【D25】2D Optical Image-Based Standards Calibration System
- 【D06】Angle Block Calibration System
- 【D15】Geodetic Angle Instruments Calibration System
- 【D14】Geodetic Length Instruments Calibration System
- 【D05】Line Scale Calibration System